Quality control of ultra-thin barrier layers (www.polyformnext.de)
Infrared sensor detects thin coatings inline
A new type of sensor makes it possible for the first time to test functional barrier layers on plastic products at production speed. The Film-Inspect testing system was developed by the Fraunhofer Institute for Physical Measurement Techniques IPM in cooperation with plasma system specialist Plasma Electronic.
read more...Quality assurance (www.polyformnext.de)
Better testing of ultra-thin barrier layers
A new type of sensor makes it possible for the first time to test functional barrier layers on plastic products at production speed. The Film-Inspect testing system was developed by the Fraunhofer Institute for Physical Measurement Techniques IPM in cooperation with plasma system specialist Plasma Electronic GmbH.
read more...Testing cold-formed components more precisely (www.industrial-production.de)
Optical inspection checks formed parts
An optical free-fall inspection system, which was developed as part of a research project funded by the German Federal Ministry for Economic Affairs and Climate Protection, inspects cold-formed components for geometric dimensional accuracy and surface quality with an accuracy of a few hundredths of a millimeter.
read more...Quality control of barrier layers (www.polyformnext.de)
Packaging food safely in monomaterial
Packaging made from monomaterials is easily recyclable, but must be provided with ultra-thin barrier layers to protect sensitive products. Fraunhofer IPM is developing an optical measuring system that can be used to test the quality of these barrier layers in the production line.
read more...Measuring in the submicrometer range (www.polyformnext.de)
Optical coordinate measuring technology for production
The Miame project aims to develop the world's first optical coordinate measuring machine for full-surface measurement of large objects on a meter scale. The aim of the application is to measure components directly on the production line quickly and with sub-micrometer accuracy.
read more...