Control 2025
Measuring devices: precision meets innovation
At Control 2025, Helmut Fischer will be presenting numerous measurement solutions for coating thickness measurement, material analysis and material testing.
Among other things, the company will be presenting the high-performance XRF measuring device Fischerscope X-Ray XDV-µ LD from the high-end X-ray fluorescence series. It was specially designed for high-precision coating thickness measurement and material analysis on the finest structures with challenging geometries. In addition to numerous application possibilities in various industries, it is suitable for precise measurement on the smallest components and structures, such as printed circuit boards or plug contacts.
The DMP series offers powerful tactile measuring devices for high flexibility in coating thickness measurement. The compact handheld devices impress with their versatile functions, robust and modern design, digital probes and intuitive software.
Control, Hall 7, Stand 7501
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