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Quality assurance

Interview with Robert Hillinger

Quality monitoring in semiconductor production

Ever smaller, ever more powerful - producers of semiconductors are facing major challenges in a market with high demand. In addition, new manufacturing processes are increasing dynamics. In this interview, Robert Hillinger, Business Development Manager at Kistler, explains how sensors for dynamic force measurement can open up previously untapped potential in the semiconductor production process in order to increase efficiency and quality.

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Small length meter

Precision in the smallest of spaces

Feinmess Suhl is expanding its portfolio with the KLM 120 small length measuring device, a further development of the KLM 60 length comparator. In addition to its innovative design, the new model is a fully-fledged universal length measuring device thanks to the additional measuring systems in the Y and Z axes.

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